Material and Device Fabrication and Characterization
The Materials for Opto/Electronics Research and Education (MORE) Center at ºÚÁϳԹÏÍø is equipped with an array of over 20 operational tools, encompassing materials deposition, sample analysis and characterization, and cleanroom facilities. Discover a full listing of our available equipment on our . Our core equipment and research capabilities include:
Material and Device Fabrication
- Creation of solution-processable and vacuum-deposited thin and thick film materials.
- Complete device fabrication and testing within an integrated 25 ft glovebox system.
- Class 10000 cleanroom equipped with sub-micrometer ultraviolet lithography capabilities.
- Precision sub-100 nm scale electron beam lithography.
Sample Characterization
- Analysis of device and surface geometry, including roughness, height, morphology, thickness, and structure from millimeters to nanometers.
- Determination of materials structure and composition via ellipsometry and spectrophotometry.
- Assessment of optical characteristics such as reflection, transmission, and absorption.
- Mechanical properties evaluation, including microindentation, hardness, scratch, and wear analysis.
- Electronic properties measurements, including 4-point probe measurements and standard solar cell performance tests.
- Fluorescent and photo-luminescent material analysis through fluorometry.